Advantest Developing Innovative Methodologies for High-Speed Scan and Software-Based ...

Retrieved on: 2021-06-17 06:56:15

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Technology

Science and technology

Electronic engineering

Electrical engineering

Electronic test equipment

Advantest

Furukawa Group

Semiconductor devices

Synopsys

Automatic test equipment

Electronic design automation

Integrated circuit

TOKYO

Advantest Corporation

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Advantest Developing Innovative Methodologies for High-Speed Scan and Software-Based .... View article details on HISWAI: https://www.globenewswire.com/news-release/2021/06/17/2248659/0/en/Advantest-Developing-Innovative-Methodologies-for-High-Speed-Scan-and-Software-Based-Functional-Testing.html

Excerpt

This novel approach can correlate scan testing results between established and new test routines, boot up and execute on-chip test software and ...

Article found on: www.globenewswire.com

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