AEM Introduces the New Generation of Automated Burn-In Systems for AI and High ... - PR Newswire

Retrieved on: 2024-07-10 17:02:01

Tags for this article:

Click the tags to see associated articles and topics

AEM Introduces the New Generation of Automated Burn-In Systems for AI and High ... - PR Newswire. View article details on hiswai:

Excerpt

High voltage stress testing is critical to ensure the reliability of AI chips and other semiconductor devices. It exposes devices under test to ...

Article found on: www.prnewswire.com