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<div>Proc. of the 5th Int. Joint Conf. on <b>Artificial Intelligence</b> (August 1977), pp. 612-618. Cambridge, MA. 17. R. Jain, H.-H. NagelOn the analysis of accumulative difference pictures from image sequences of real world scenes. IEEE Trans. on Pattern Analysis and Machine Intelligence, 1 (2) (1979), pp. 206- ...</div>
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