Article Details

Extreme UV chip defects may force a new approach to processor design

Retrieved on: 2018-02-27 05:14:28

Tags for this article:

Click the tags to see associated articles and topics

Extreme UV chip defects may force a new approach to processor design. View article details on hiswai:

Excerpt

<div><b>Chips</b> that combine memory with processing elements and <b>chips</b> based on neural networks are more resilient to manufacturing defects, as the individual bad elements can be disabled while still salvaging the <b>chip</b> as a whole. <b>IBM's True</b> <b>North</b> neuron-simulating processor has a grid of 4096 elements, ...</div>

Article found on:

View Original Article

This article is found inside other hiswai user's workspaces. To start your own collection, sign up for free.

Sign Up